Publication Type:

Journal Article


Computers & Geosciences, Elsevier, Amsterdam, Netherlands, Volume 38, Number 1, p.156-163 (2012)




data processing, digital data, geometry, mathematical methods, mineral composition, mineralogy, optimization, patterns, Petrology, standard materials, x-ray diffraction data


A new program capable of rapidly and accurately reducing a two-dimensional X-ray diffraction pattern obtained from a Debye-Scherrer or Gandolfi camera to a quantitative digital diffractogram is described. By implementing geometric optimization routines based on the symmetry and sharpness of diffraction lines, the optimal configuration of the camera, X-ray path, and sample can be determined, thus providing the best possible set of integration parameters. Results for NIST standard reference materials 640c (Si) and 676 (Al (sub 2) O (sub 3) ) are included to illustrate program functionality. Abstract Copyright (2012) Elsevier, B.V.


GeoRef, Copyright 2018, American Geological Institute.<br/>2012-051399