Publication Type:

Journal Article

Authors:

Henda, Redhouane; Al-Shareeda, Omar; McDonald, Andrew; Pratt, Allen

Source:

Applied Physics A: Materials Science and Processing, Springer Verlag, Volume 108, Number 4, p.967-974 (2012)

ISBN:

09478396

Keywords:

Ablation, Atmospheric temperature, Atomic force microscopy, Deposition, Electron beams, Electron sources, Electrons, iron, Pyrites, Scanning electron microscopy, substrates, X ray diffraction

Abstract:

Pulsed electron beam ablation is a relatively novel deposition technique with some unique advantages, such as ease for scale-up and low operating cost. In this work, we report on the preparation of iron pyrite (FeS2) on 1.5-cm2glass substrates through the pulsed electron beam ablation of a single synthetic target. The 40-120-nm-thin films were deposited at a substrate temperature ranging from room temperature to 250C and under a background argon atmosphere of 3.5 mTorr. Different characterization techniques have been used to analyze the deposited films, such as grazing-angle x-ray diffraction (XRD), X-ray photon spectroscopy (XPS), visible Raman spectroscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM), and visible optical reflectance spectroscopy. The findings show that iron pyrite can be obtained at high temperature in association with other phases. 2012 Springer-Verlag.

Notes:

Compilation and indexing terms, Copyright 2018 Elsevier Inc.<br/>20123515375712<br/>Characterization techniques<br/>Deposition technique<br/>Grazing-angle x-ray diffractions<br/>Pulsed electron ablations<br/>Pulsed electron beams<br/>Substrate temperature<br/>Visible Raman Spectroscopy<br/>X ray photon spectroscopy